Kumari, B. Leela, University college of Engineering, JNTUK, India
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Vol 6, No 1: March 2017 - Electronics Device and Semiconductor
On-chip Generation of Functional Tests with Reduced Delay and Power
Abstract PDF
Bulletin of Electrical Engineering and Informatics (BEEI)
ISSN: 2089-3191, e-ISSN: 2302-9285
This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).