On, Chin Kim, Universiti Malaysia Sabah, Malaysia
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Vol 10, No 2: April 2021 - Special Invitation
Real-time mask detection and face recognition using eigenfaces and local binary pattern histogram for attendance system
Abstract PDF
Bulletin of Electrical Engineering and Informatics (BEEI)
ISSN: 2089-3191, e-ISSN: 2302-9285
This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).