Rashid, Marzaini, Universiti Sains Malaysia (USM), Malaysia
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Vol 10, No 5: October 2021 - Electronics Device and Semiconductor
Investigation on the ohmic characteristic of Ni/Ti/4H-SiC
Abstract PDF
Bulletin of Electrical Engineering and Informatics (BEEI)
ISSN: 2089-3191, e-ISSN: 2302-9285
This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).