A., Potapov L., Bryansk State Technical University, Russian Federation
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Vol 9, No 3: June 2020 - Electronics Device and Semiconductor
Determination of transient thermal characteristics for thermal electric behavioral models of integrated circuits
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Bulletin of Electrical Engineering and Informatics (BEEI)
ISSN: 2089-3191, e-ISSN: 2302-9285
This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).