Napiah, Z. A. F. M., Universiti Teknikal Malaysia Melaka, Malaysia

• Vol 10, No 5: October 2021 - Electronics Device and Semiconductor
  Investigation on the ohmic characteristic of Ni/Ti/4H-SiC
  Abstract  PDF

Bulletin of EEI Statistics

Bulletin of Electrical Engineering and Informatics (BEEI)
ISSN: 2089-3191 , e-ISSN: 2302-9285
This journal is published by the Institute of Advanced Engineering and Science (IAES) .