Cross-project software defect prediction through multiple learning

Yahaya Zakariyau Bala, Pathiah Abdul Samat, Khaironi Yatim Sharif, Noridayu Manshor

Abstract


Cross-project defect prediction is a method that predicts defects in one software project by using the historical record of another software project. Due to distribution differences and the weak classifier used to build the prediction model, this method has poor prediction performance. Cross-project defect prediction may perform better if distribution differences are reduced, and an appropriate individual classifier is chosen. However, the prediction performance of individual classifiers may be affected in some way by their weaknesses. As a result, in order to boost the accuracy of cross-project defect prediction predictions, this study proposed a strategy that makes use of multiple classifiers and selects attributes that are similar to one another. The proposed method's efficacy was tested using the Relink and AEEEM datasets in an experiment. The findings of the experiments demonstrated that the proposed method produces superior outcomes. To further validate the method, we employed the Wilcoxon sum rank test at 95% significance level. The approach was found to perform significantly better than the baseline methods.

Keywords


Attribute selection; Cross-project; Multi-learning; Software defect; Stacking

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DOI: https://doi.org/10.11591/eei.v13i3.5258

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Bulletin of EEI Stats

Bulletin of Electrical Engineering and Informatics (BEEI)
ISSN: 2089-3191, e-ISSN: 2302-9285
This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).