Leakage Immune 9T-SRAM Cell in Sub-threshold Region

Priya Gupta, Anu Gupta, Abhijit Asati

Abstract


The paper presents a variability-aware modified 9T SRAM cell. In comparison to 6T SRAM cell the proposed  cell achieves 1.3× higher read-SNM and 1.77× higher write-SNM with 79.6% SINM (static current noise margin) distribution at the expense of 14.7× lower WTI (write trip current) at 0.4 V power supply voltage, while maintaining similar stability in hold mode. Thus, comparative analysis exhibits that the proposed design has a significant improvement, thereby achieving high cell stability at 45nm technology.


Keywords


Low power SRAM; Process variations; Sub-threshold SRAM; Static noise margin; Stability

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DOI: https://doi.org/10.11591/eei.v5i1.557

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